GI20干涉儀

• 瀏覽次數(shù)：3226
• 更新時(shí)間：2016-04-19

產(chǎn)品簡(jiǎn)介：

The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm （6"）Ø.

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The GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surfaces up to 150mm (6”)Ø. Unlike conventional fizeau interferometers, the GI20 can measure

non-reflective surfaces, ideal for analysing lapped and/or ground surfaces prior to final polishing. The interferogram is displayed on a LCD screen on the front of the unit.

• High precision flatness measurement of ground, lapped or semi-polished samples

• Measure 2μm per fringe with excellent clarity

• Surface roughness measurement from 1nm to 300nm Ra